000 01384cam a22003374a 4500
001 12790779
003 UDS
005 20170508073626.0
008 020529s2002 nyua b 001 0 eng
010 _a 2002070731
020 _a0387955313 (softcover : acidfree paper)
040 _aDLC
_cDLC
_dDLC
_dUDS
_bENG
042 _apcc
050 0 0 _aQA277
_b.I51
100 1 _aIngster, Yu. I.
245 1 0 _aNonparametric Goodness-Of-Fit Testing Under Gaussian Models /
_cYu. I. Ingster, I. A. Suslina.
260 _aNew York :
_bSpringer,
_cc2002.
300 _axiv, 452 p.:
_bill. ;
_c24 cm.
490 1 _aLectures notes in statistics ;
_v169
504 _aIncludes Bibliographical References (p. [444]-449) and Index.
600 _2Mathematics
650 0 _aGoodness-of-fit tests.
650 0 _aNonparametric statistics.
700 1 _aSuslina, I. A.
830 0 _aLecture notes in statistics (Springer-Verlag) ;
_vv. 169.
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0817/2002070731-d.html
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/enhancements/fy0817/2002070731-t.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f20
_gy-gencatlg
942 _2lcc
_cBK
999 _c17613
_d17613